Evolution of Atom Probe Data Collection Toward Optimized and Fully Automated Acquisition

Journal Article Evolution of Atom Probe Data Collection Toward Optimized and Fully Automated Acquisition Get access Ty J Prosa, Ty J Prosa CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar David A Reinhard, David A Reinhard CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar HG Francois-Saint-Cyr, HG Francois-Saint-Cyr CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar Isabelle Martin, Isabelle Martin CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar Katherine P Rice, Katherine P Rice CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar Yimeng Chen, Yimeng Chen CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar David J Larson David J Larson CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI 53711 USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 616–617, https://doi.org/10.1017/S1431927617003750 Published: 04 August 2017