Evolution And Revolution Of Electrostatic Discharge (Esd) And Electrical Overstress (Eos) Testing For Components And Systems

2016 13TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT)（2016）

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摘要

Significant change has occurred in the ESD and EOS testing of components and systems [1-7]. Evolutionary and revolutionary changes has occurred in the electronic industry in the area of testing of components and systems. Tn this paper, testing will be discussed in ESD, EOS, latch-up, and electromagnetic compatibility (EMC) and the evolution of new testing standards, test equipment, and testing methodologies.

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关键词

EMC,electromagnetic compatibility,latch-up,electronic industry,EOS testing,electrical overstress testing,ESD,electrostatic discharge

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