Reliability Characterizations for high-performance, low-power 10nm-FinFET technology K. Choi,M. Jin,Jinju Kim,Jungin Kim, H. Sagong,Y. Kim,H. Shim,K. Kim,G. Kim,S. Lee,T. Uemura, J. Park,S. Shin,S. PaeThe Japan Society of Applied Physics(2017)引用 0|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要