Silicon Heterojunction System Field Performance

IEEE Journal of Photovoltaics(2018)

引用 51|浏览55
暂无评分
摘要
A silicon heterostructure photovoltaic system fielded for 10 years has been investigated in detail. The system has shown degradation, but at a rate similar to an average Si system, and still within the module warranty level. The power decline is dominated by a nonlinear Voc loss rather than more typical changes in Isc or Fill Factor. Modules have been evaluated using multiple techniques including:...
更多
查看译文
关键词
Degradation,Temperature measurement,Silicon,Heterojunctions,Uncertainty,Photovoltaic systems,Electrical resistance measurement
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要