Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC

Raichelle Aniceto,Slaven Moro,Randall Milanowski, Christopher Isabelle, Norman Hall,Bert Vermeire,Kerri Cahoy

2017 IEEE Radiation Effects Data Workshop (REDW)（2017）

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摘要

Experimental assessment of commercial 100/200 Gbps optical coherent DSP modem ASIC completed with 64 MeV and 480 MeV proton radiation test campaigns. Single event effect cross sections calculated and no performance degradation observed for proton fluence levels up to 1.27×10 ¹² p/cm ² with equivalent total ionizing dose exposure to 170 krad(Si).

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关键词

single event effect cross sections,proton fluence levels,total ionizing dose assessment,proton radiation test,total ionizing dose exposure,commercial optical coherent DSP modem ASIC,electron volt energy 64.0 MeV,radiation absorbed dose 170.0 krad,electron volt energy 480.0 MeV,bit rate 100 Gbit/s,bit rate 200 Gbit/s

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