Analysis of temporal masking effect on single-event upset rates for sequential circuits

Rongmei Chen,Z. J. Diggins,N. N. Mahatme, L. Wang,En Xia Zhang,Y. P. Chen,Yaqiang Liu,Balaji Narasimham,Arthur F. Witulski,B. L. Bhuva

2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS)（2016）

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摘要

Reduction in single-event upset rates for sequential circuits due to temporal masking effect is evaluated. Effects of supply voltage, combinational-logic delay and particle LET are analyzed for sequential circuits SEU rates.

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关键词

Single event upset (SEU),single event transient (SET),soft errors,sequential circuit,temporal masking effect

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