Total Dose Testing of Advanced Mixed Signal ADC/DAC Microcircuits

David Alexander,Alonzo Vera,James Aarestad,Gabriel V. Urbaitis

2017 IEEE Radiation Effects Data Workshop (REDW)（2017）

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摘要

Total dose test results are presented for the Maxim 1257/1258 multi-channel ADC/DAC, and the Linear Technology LTC2378-20 low power SAR ADC. The paper discusses radiation testing challenges of complex mixed signal circuits.

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关键词

total dose testing,advanced mixed signal ADC/DAC microcircuits,Maxim 1257/1258 multichannel ADC/DAC,Linear Technology LTC2378-20 low power SAR ADC,radiation testing challenges,complex mixed signal circuits

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