Low-cost single event double-upset tolerant latch design

This Letter proposes a low-cost, single event double-upset tolerant latch which utilises interlocked nodes to keep data, clock gating (CG) in Muller C-element (MCE) to turn off the storage cell, a three-input MCE to block the soft error from the storage cell and a weak keeper to prevent high impedance state. The storage cell in the proposed latch has better reliability than the conventional triple...