Towards Mm-Wave Nanoelectronics And Rf Switches Using Mos2 2d Semiconductor

international microwave symposium(2018)

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摘要
In this paper, we report state-of-the-art large area CVD monolayer MoS2-based RF transistors and RF switches. An embedded gate structure was used to fabricate short channel CVD MoS2 RF FETs with an intrinsic f(T) of 20 GHz, intrinsic f(max) of 11.4 GHz, and the high-field saturation velocity v(sat) of 1.88 x 10(6) cm/s. The gate-first process allows for enhancement mode operation, I-ON/I-OFF ratio of 10(8), and a transconductance (g(m)) of 70 mu S/mu m. Also, we use a vertical MIM structure for a RF switch based on CVD MoS2. The device was programmed with a voltage as low as 1 V, and achieves an ON-state resistance of similar to 5 Omega and an OFF-state capacitance of similar to 6 fF. We measured and simulated the RF performance of the device up to 50 GHz and report 0.5 dB insertion loss, 15 dB isolation (both at 50 GHz), and 5 THz cutoff frequency.
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关键词
Two-dimensional material,TMD,CVD Mos2,Rf applications,transistors,RF switches,GHz regime
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