Fast Characterization Of System Level Esd Noise Coupling To Real Motherboard In Notebook

This work presents a method for the fast and efficient characterization of the system level electrostatic discharge (ESD) noise coupling to real portable computer (notebook) motherboard. The coupled noise to the commercial laptop motherboard, in both operational and non-operational conditions, is predicted in SPICE type circuit simulator using the derived coupling transfer impedance function from scattering (S) parameters. S-parameters between the aggressor and victim positions are measured using the proposed different method, without any modification in ESD generator, for the calculation of the coupling transfer impedance function. A good degree of accuracy is observed between the time domain measured and simulated results using proposed method.