VOLTAGE VARIATIONS ARE A MAJOR CHALLENGE IN PROCESSOR DESIGN .H ERE, RESEARCHERS CHARACTERIZE THE VOLTAGE NOISE CHARACTERISTICS OF PROGRAMS AS THEY RUN TO COMPLETION ON A PRODUCTION CORE 2D UO PROCESSOR. FURTHERMORE, THEY CHARACTERIZE THE IMPLICATIONS OF RESILIENT ARCHITECTURE DESIGN FOR VOLTAGE VARIATION IN FUTURE SYSTEMS.
international symposium on microarchitecture(2011)
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