Set-Up Of A High-Resolution 300 Mk Atomic Force Microscope In An Ultra-High Vacuum Compatible He-3/10 T Cryostat

H von Allwörden, K Ruschmeier, A Köhler,T Eelbo,A Schwarz,R Wiesendanger

REVIEW OF SCIENTIFIC INSTRUMENTS(2016)

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摘要
The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped He-3 reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where the tip and sample can be exchanged in situ. Moreover, single atoms or molecules can be evaporated onto a cold substrate located inside the microscope. Two side chambers are equipped with standard surface preparation and surface analysis tools. The performance of the microscope at low temperatures is demonstrated by resolving single Co atoms on Mn/W(110) and by showing atomic resolution on NaCl(001). Published by AIP Publishing.
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