New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE

Journal Article New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE Get access Matthew R Linford, Matthew R Linford Departments of Chemistry and Biochemistry and Search for other works by this author on: Oxford Academic Google Scholar Bhupinder Singh, Bhupinder Singh Departments of Chemistry and Biochemistry and Search for other works by this author on: Oxford Academic Google Scholar Daniel Velázquez, Daniel Velázquez Department of Physics, Illinois Institute of Technology, Chicago, IL, USA Search for other works by this author on: Oxford Academic Google Scholar Jeff Terry, Jeff Terry Department of Physics, Illinois Institute of Technology, Chicago, IL, USA Search for other works by this author on: Oxford Academic Google Scholar Jacob D Bagley, Jacob D Bagley Departments of Chemistry and Biochemistry and Search for other works by this author on: Oxford Academic Google Scholar Dennis H Tolley, Dennis H Tolley CINVESTAV-Unidad Queretaro, Queretaro, Mexico Search for other works by this author on: Oxford Academic Google Scholar Anubhav Diwan, Anubhav Diwan Departments of Chemistry and Biochemistry and Search for other works by this author on: Oxford Academic Google Scholar Varun Jain, Varun Jain Departments of Chemistry and Biochemistry and Search for other works by this author on: Oxford Academic Google Scholar Alberto Herrera-Gomez Alberto Herrera-Gomez CINVESTAV-Unidad Queretaro, Queretaro, Mexico Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 344–345, https://doi.org/10.1017/S1431927616002579 Published: 25 July 2016