Simultaneous High-Speed DualEELS and EDS Acquisition at Atomic Level Across the LaFeO3 / SrTiO3 Interface

Journal Article Simultaneous High-Speed DualEELS and EDS acquisition at atomic level across the LaFeO3 / SrTiO3 interface Get access P Longo, P Longo Gatan Inc. 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA Search for other works by this author on: Oxford Academic Google Scholar T Topuria, T Topuria IBM Research Division, Almaden Research Center, San Jose, CA, 95120, USA Search for other works by this author on: Oxford Academic Google Scholar P Rice, P Rice IBM Research Division, Almaden Research Center, San Jose, CA, 95120, USA Search for other works by this author on: Oxford Academic Google Scholar A Aitouchen, A Aitouchen Gatan Inc. 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA Search for other works by this author on: Oxford Academic Google Scholar PJ Thomas, PJ Thomas Gatan Inc. 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA Search for other works by this author on: Oxford Academic Google Scholar RD Twesten RD Twesten Gatan Inc. 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1857–1858, https://doi.org/10.1017/S1431927615010065 Published: 23 September 2015