Effects of mechanical stresses on the reliability of low-temperature polycrystalline silicon thin film transistors for foldable displays
Solid-State Electronics(2017)
摘要
•Dynamic and static mechanical stress tests for the reliability of LTPS TFT.•TFT characteristic variation by mechanical strain dependent lattice constant.•Comparison of dynamic and static mechanical stress.•Comparison of compressive and tensile mechanical stress.
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关键词
Foldable thin film transistor,Static mechanical stress,Dynamic mechanical stress,Low temperature polycrystalline silicon,Reliability
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