Advancing Correlative STEM Analysis Methods for FE-SEM

Journal Article Advancing Correlative STEM Analysis Methods for FE-SEM Get access David C Bell, David C Bell Harvard John A. Paulson School of Engineering and Applied Sciences, Harvard University, Cambridge, MA Search for other works by this author on: Oxford Academic Google Scholar Natasha Erdman, Natasha Erdman JEOL USA Inc., Peabody, MA Search for other works by this author on: Oxford Academic Google Scholar Masateru Shibata Masateru Shibata JEOL USA Inc., Peabody, MA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 560–561, https://doi.org/10.1017/S1431927617003488 Published: 04 August 2017