Nanoscale reduction of resistivity and charge trap activities induced by carbon nanotubes embedded in metal thin films

We mapped the nanoscale reduction of resistivity and noise source activities induced by metallic single walled carbon nanotubes (m-SWCNTs) embedded in gold thin films. In this method, current and noise maps of m-SWCNTs/gold hybrid thin films were recorded using a conducting probe in contact with the surface, and the maps were utilized to estimate the nanoscale variation of resistivity (ρ) and the density distribution of noise sources (Neff) generating electrical noises in the hybrid thin film. The m-SWCNTs/gold hybrid thin films with a 5 nm thick gold layer exhibited 300% improved conductivity compared to that of pristine gold thin films. Additionally, the regions with embedded m-SWCNTs showed significantly reduced noise source densities compared with pristine gold film regions. These results clearly show that embedded m-SWCNTs improve the conductivity and reduce electrical noises of metallic electrodes. Interestingly, we observed that the ρ and the Neff on both m-SWCNTs/gold hybrid and pristine gold regions exhibited a scaling behavior of ρ ∝Neff0.5, implying the hopping charge conduction and noise characteristics of m-SWCNTs/gold hybrid films. Our works can be a useful guideline for the development of high performance electrodes based on CNTs.