Effect of Ti additions on structure and phase stability of Sb 2 Te 3 thin films by experimental and theoretical methods

Journal of Materials Science: Materials in Electronics(2017)

引用 3|浏览10
暂无评分
摘要
Influence of Ti additions in Sb 2 Te 3 thin films on structure and phase stability was studied by experiments together with theoretical calculations. The incorporation of Ti atoms in the Sb 2 Te 3 thin films caused formation of finer grains. By X-ray photoelectron spectroscopy and ab initio calculation, both the Sb and Te atoms are likely to be replaced by the Ti atoms to form Ti–Sb and Ti–Te covalent bonds. It suggests that the Ti atoms locate in Te1 position and interstice of the lattice.
更多
查看译文
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要