Effect of Ti additions on structure and phase stability of Sb 2 Te 3 thin films by experimental and theoretical methods
Journal of Materials Science: Materials in Electronics(2017)
摘要
Influence of Ti additions in Sb 2 Te 3 thin films on structure and phase stability was studied by experiments together with theoretical calculations. The incorporation of Ti atoms in the Sb 2 Te 3 thin films caused formation of finer grains. By X-ray photoelectron spectroscopy and ab initio calculation, both the Sb and Te atoms are likely to be replaced by the Ti atoms to form Ti–Sb and Ti–Te covalent bonds. It suggests that the Ti atoms locate in Te1 position and interstice of the lattice.
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