Transmission Electron Microscopy At The Max-Planck-Institut Fur Metallforschung

An overview is given on the different instruments and methods in transmission electron microscopy which are present at the Max-Planck-Institut fur Metallforschung and on their possible applications. Advanced techniques are described which offer quantitative, atomicscale information on structure, chemical composition and bonding at internal boundaries. Results on the Cu/Al2O3 interface are presented as an example. It is shown that only the use of complementary techniques allows a characterization of the interface structure at atomic level.