Cycling-Induced Charge Trapping/Detrapping in Flash Memories—Part II: Modeling

Starting from all the experimental evidence we presented in Part I of this work (Resnati et al., 2016), in this paper, we propose a new microscopic picture for cycling-induced charge trapping/detrapping in Flash memories. This picture involves structural relaxation of the charged tunnel-oxide defects as limiting step in the detrapping process, triggering the possibility for defects to exchange car...