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PIN sensor array response to heavy-ion particles in bulk and SOI technologies

2017 32nd Symposium on Microelectronics Technology and Devices (SBMicro)(2017)

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摘要
The PIN sensor array in two technologies (bulk and SOI) is studied here, based on fabricated lateral PIN. Experimental data in non-radiation environment is used to adjust the models implemented in the numerical simulator that are latter used to evaluate the radiation analysis for heavy-ion particles. Near-Earth natural environment is composed of energetic protons, electrons, and heavy-ions coming from galactic cosmic ray and solar events. Radiation sensors come as a vital part to study and monitor energetic particles in radiation environments.
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关键词
PIN Sensor Array,Heavy-Ion,Bulk,SOI
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