PIN sensor array response to heavy-ion particles in bulk and SOI technologies
2017 32nd Symposium on Microelectronics Technology and Devices (SBMicro)(2017)
摘要
The PIN sensor array in two technologies (bulk and SOI) is studied here, based on fabricated lateral PIN. Experimental data in non-radiation environment is used to adjust the models implemented in the numerical simulator that are latter used to evaluate the radiation analysis for heavy-ion particles. Near-Earth natural environment is composed of energetic protons, electrons, and heavy-ions coming from galactic cosmic ray and solar events. Radiation sensors come as a vital part to study and monitor energetic particles in radiation environments.
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关键词
PIN Sensor Array,Heavy-Ion,Bulk,SOI
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