Characterization of Electron Beam Damage to (Bi x Sb 1-x ) 2 Te 3 -Based Topological InsulatorsLinsey Rodenbach,Ilan Rosen, Eli Fox,Lei Pan,Peng Zhang,Kang Wang,David Goldhaber-GordonBulletin of the American Physical Society(2019)引用 23|浏览5暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要