A Capacitively-Degenerated High-Linearity Dynamic Amplifier Using A Real-Time Gain Detection Technique

This paper presents a high linearity dynamic amplifier with an on-chip gain detection technique, which realizes the stabilization of process, voltage, and temperature (PVT) with the real-time fluctuation. Based on the cross-coupled capacitive degeneration topology and characteristics of transistors in weak inversion, according to the simulation results, the proposed dynamic amplifier achieves -80 dB total harmonic distortion (THD) across the wide range of supply voltage and temperature. The prototype amplifier is designed at the supply voltage of 1 V in 28 nm CMOS process, and it dissipates 260 mu W at the frequency of 100 MS/s with the maximum output swing of 1.2 V-pp. The power consumption is positively related to the clock frequency.