Crystalline Orientation Identification Of Phosphorene Using Polarized Raman Spectroscopy Without Analyzer

Featured ApplicationScientific investigation on interface mechanics of 2-D nanomaterials, Design and manufacture of new semiconductor device based on nano-heterostructure.Abstract The unique photoelectric properties of phosphorene typically include anisotropy, hence the nondestructive and rapid identification of its crystal orientation is a key point to the investigation and application of phosphorene. Currently, the orientation identification by analyzing the A(g)(1) mode based on parallel-polarized Raman has severe requirements for the applicable Raman system. Therefore, it is necessary to develop a more general, convenient, and accurate method for determining the crystal orientation of phosphorene. In this paper, a method of orientation identification was proposed by using a Raman system without an analyzer and quantifying the correlation between the intensities of A(g)(1) and A(g)(2) modes with the change of the incident polarization direction. By using mechanically peeled phosphorene as specimens, Raman measurements were carried out under the Raman configurations of both parallel polarization and with no analyzer. The results show that the crystal orientation of phosphorene can be accurately identified by quantifying the Raman intensities of both A(g)(1) and A(g)(2) modes using the Raman system without an analyzer.