Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry

IEEE Transactions on Electron Devices(2019)

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摘要
In this paper, we show that quantum Hall resistance measurements using two terminals may be as precise as four-terminal measurements when applying superconducting split contacts. The described sample designs eliminate resistance contributions of terminals and contacts such that the size and complexity of next-generation quantized Hall resistance devices can be significantly improved.
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关键词
Resistance,Electrical resistance measurement,Temperature measurement,Standards,Magnetic devices,Voltage measurement,Graphene
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