Statistical Variation Aware Leakage and Total Power Estimation of 16 nm VLSI Digital Circuits Based on Regression Models.Deepthi Amuru,Andleeb Zahra,Zia AbbasVDAT（2019）引用 2|浏览0暂无评分关键词Machine learning (ML), Leakage power, CMOS, VLSIAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
