Tera-sample-per-second single-shot device analyzer.

With the ever-increasing need for bandwidth in data centers and 5G mobile communications, technologies for rapid characterization of wide-band devices are in high demand. We report an instrument for extremely fast characterization of the electronic and optoelectronic devices with 27 ns frequency-response acquisition time at the effective sampling rate of 2.5 Tera-sample/s and an ultra-low effective timing jitter of 5.4 fs. This instrument features automated digital signal processing algorithms including time-series segmentation and frame alignment, impulse localization and Tikhonov regularized deconvolution for single-shot impulse and frequency response measurements. The system is based on the photonic time stretch and features phase diversity to eliminate frequency fading and extend the bandwidth of the instrument. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement