Recipes to build-up a rad-hard CMOS memory

2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)(2019)

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摘要
Rad-Hard memories are becoming increasingly popular for space applications such as electronics on-board satellites. Unlike the components used in terrestrial mass application, their peculiarities are not the available storage size, but the resiliency to the physical effects present in space (electrons, protons, heavy ions, etc.). This paper describes the methodologies needed to develop a rad-hard memory, by acting at all levels of the top-down design pyramid.
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关键词
Space Electronics,Radiation-Hardening-by-design (RHDB),SRAM,OTP,Flash,Total Ionizing Dose (TID),EdgeLess Transistors (ELT),Single Event Effects (SEE)
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