Visualizing Material Quality and Similarity of mc-Si Wafers Learned by Convolutional Regression Networks

Convolutional neural networks can be trained to assess the material quality of multicrystalline silicon wafers. A successful rating model has been presented in a related work, which directly evaluates the photoluminescence (PL) image of the wafer to predict the current-voltage parameters after solar cell production. This paper presents the results of two visualization techniques to understand what...