Multi-order Scaling of High-throughput Transmission Electron Microscopy.

Christopher S. Own, Theodore DeRego, Lawrence S. Own,Gerward Weppelman,Adrian A. Wanner,Sebastian Ströh,Eric Hammerschmith,Ashwin Vishwanathan,H. Sebastian Seung

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada（2019）

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