Effect Of Sey In Low Energy Region On Multipactor Threshold Of The High Frequency Microwave Components

The secondary electron emission yield (SEY) in the low energy region (0-50eV) has always been an important parameter that restricting the performance of electron accelerators, high power microwave sources and space microwave devices. In this paper, a new method of approximate measurement of secondary electron emission yield with "double-meter method" at incident energy less than 50 eV is introduced based on the commonly used measurement methods and the inherent conditions and structural characteristics of existing equipment. According to the experimental results and the data published in the international research, the accuracy of the measurement theory and experimental operation is verified, and a set of SEY curves of common metals in low energy region are obtained. Finally, the impedance transformer is designed to simulate the multipactor and compare with the measured results, which is used to study the influence of low-energy secondary electron emission coefficient on the threshold of multipactor. It is found that the SEY curve containing the low-energy region greatly improves the simulation accuracy of multipactor. The error between the simulation value and the measured value is less than 2%.