Passive Intermodulation Source Localization Based on Emission Source Microscopy

IEEE Transactions on Electromagnetic Compatibility(2020)

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摘要
Emission source microscopy (ESM) technique can be used for localization and characterization of electromagnetic interference sources by measuring the magnitude and phase of the electromagnetic field in the far-field zone. This article presents a method which uses ESM to locate sources of passive intermodulation (PIM). Compared to the traditional methods of PIM source localization techniques includ...
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关键词
Probes,Antennas,Antenna measurements,Base stations,Phase measurement,Focusing,Signal to noise ratio
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