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On a Method for Segmentation of Memory Instances with Row Redundancies

2019 IEEE East-West Design & Test Symposium (EWDTS)(2019)

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摘要
In this extended abstract, we proposed a method for “segmentation” of large memory instances with global redundant rows into memory segments with local redundant sub-rows allowing, thus, to split the memory into segments and the redundant rows - into local redundant sub-rows. A segment has its own local redundant sub-rows. Each redundant sub-row is a corresponding segment of a global redundant row. Thus, we increase significantly the number of redundant sub-rows and repair the faults/defects occurring in a memory segment with its local redundant sub-rows. For large memory instances, this approach will allow to increase the repair coverage of the memory instance with negligible hardware and time overheads. In general, a trade-off between fault/defect coverage and hardware/time overheads should be done.
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关键词
Memory system,repair,local/global redundancy,repair coverage
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