Probe-Sample Interaction In Aperture-Type Thz Near-Field Microscopy Of Complementary Resonators

2019 44TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ)(2019)

引用 0|浏览23
暂无评分
摘要
Subwavelength complementary metallic resonators operating in the terahertz (THz) regime arc investigated with aperture near-field microscopy and spectroscopy. In contrast to far-field methods, the spectra of individual isolated resonators can be retrieved. We find that we can experimentally gain spectral information without modifying the spectral properties of the resonator with the aperture-type near-field probe by operating it at a separation distance greater than 10 mu m.
更多
查看译文
关键词
probe-sample interaction,complementary resonators,subwavelength complementary metallic resonators,aperture near-field microscopy,far-field methods,spectral information,spectral properties,near-field probe,separation distance
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要