Improvement Of Ti-Based Superconducting Transition Edge Sensors With Dielectric Mirror

P. Z. Li,W. Zhang, Y. Geng, J.Q. Zhong,Z. Wang,W. Miao,Y. Ren, Q.J. Yao, K.M. Zhou,J.F. Wang, S.C. Shi

2019 44TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ)（2019）

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摘要

We have improved the detection efficiency of Ti-based superconducting transition edge sensor(TES) with the integration of dielectric mirror at the operation wavelength of 1550 nm. The TES fabricated on the dielectric mirror is coupled to the optical fiber using hack-side through-chip imaging. The measured effective response time is several mu s and the detection efficiency is improved to 30%.

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关键词

superconducting transition edge sensors,dielectric mirror,TES,optical fiber,back-side through-chip imaging,wavelength 1550.0 nm,efficiency 30 percent,Ti

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