Corrections to “High Performance Si Nanowire TFTs With Ultrahigh On/Off Current Ratio and Steep Subthreshold Swing”

IEEE Electron Device Letters（2020）

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摘要

In the referenced article, the corresponding authors should be Danfeng Pan (pdf@nju.edu.cn) and Linwei Yu (yulinwei@nju.edu.cn).

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关键词

Performance evaluation,Silicon,Microstructure,Nanoscale devices,Indexes,Collaboration,Technological innovation

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