Modeling and analysis for the effects of gamma irradiation on the DC and AC performance in InGaP/GaAs SHBTs

The effects of gamma irradiation on the DC and AC characteristics of InGaP/GaAs single heterojunction bipolar transistors (SHBTs) are investigated comprehensively for the first time, which is based on experimental data before irradiation, after irradiation and after annealing. A simplified VBIC device model is developed to describe the DC and AC characteristics of the devices. The model parameters are extracted from experimental data before irradiation, after irradiation and after annealing. Finally, the degraded rates of model parameters are used to study the radiation-induced degradation of the device performance.