Total Dose Homogeneity Of Commercial Off The Shelf Bicmos And Bipolar Voltage References At Low Dose Rate

D. M. Hiemstra,S. Shi,Z. Li,L. Chen,V. Kirischian

2019 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW)（2019）

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摘要

Total dose homogeneity of biCMOS and bipolar voltage references at low dose rate is presented. Radiation hardness assurance implications and performance in the space radiation environment are discussed.

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关键词

voltage reference, biCMOS, bipolar, low dose rate sensitivity

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