X-ray photoelectron and resistivity studies of the Pd-covered Ce thin films

P. Skokowski, A. Marczyńska,S. Pacanowski,T. Toliński,M. Wachowiak,B. Szymański,Ł. Majchrzycki,L. Smardz

Journal of Magnetism and Magnetic Materials（2020）

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摘要

•Thin films of Ce – successful prevention from oxidation by usage of Pd overlayers.•XPS studies – Ce is at a border between fluctuating valence and a localized state.•Resistivity studies – the interface Ce-Pd with Kondo lattice and impurity effects.•The dimensional effect switches at dCe = 50 nm.

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关键词

Thin films,Kondo effect,Photoelectron spectroscopy,Dimensional effects

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