Sub-nA Low-Current HZO Ferroelectric Tunnel Junction for High-Performance and Accurate Deep Learning Acceleration

2019 IEEE International Electron Devices Meeting (IEDM)(2019)

引用 34|浏览44
暂无评分
摘要
This paper presents a unique opportunity of HZO ferroelectric tunnel junction (FTJ) for in-memory computing. The device operates at an extremely low sub-nA current while simultaneously achieving 50-ns fast switching, > 10 7 cycling endurance, > 10-yr retention, minimal variability, and analog state modulation. We analyze an FTJ-based deep binary neural network. It achieves better accuracy and remarkable 702, 101, and 7×10 4 times improvements in power, area, and energy-area product efficiency compared with those using NVMs with a typical μA cell current designed for fast memory access.
更多
查看译文
关键词
low-current HZO ferroelectric tunnel junction,energy-area product,fast memory access,analog state modulation,in-memory computing,accurate deep learning acceleration
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要