Identifiability of single crystal plasticity parameters from residual topographies in Berkovich nanoindentation on FCC nickel

•A method is built to quantify the information richness of Berkovich nanoindentation imprints at grain scale.•An identifiability index is used to design a well-posed parameter identification problem from Berkovich residual topographies.•Combining imprints, and especially pile-ups, improves the conditioning of the inverse problem.•The interaction matrix of FCC structure seems identifiable using three topographies.