Parametric study on the Void Risk in FC-POP Molded Underfill Process using a Novel Porous Media, Two-Phase, Compressible Flow Simulation Method

IEEE Transactions on Device and Materials Reliability(2020)

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摘要
Molded underfill process provides many benefits for higher productivity and lower cost over the conventional capillary underfill process. However, the void defects in a molded underfill process could cause pop-corning effect and solder extrusion during the reflow process. This paper presents a highly efficient and accurate hybrid model that can be applied to diagnose the void risk in vacuum molded...
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Computational modeling,Mathematical model,Media,Vents,Atmospheric modeling,Electromagnetic compatibility,Visualization
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