Impact of Traps on the Adjacent Channel Power Ratios of GaN HEMTs

IEEE Electron Device Letters(2020)

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摘要
In this work, the impact of traps on a system level parameter, ACPR (adjacent channel power ratio), of commercial RF AlGaN/GaN HEMTs were studied. ACPR usually depends on the transistor linearity and stability, and in this study it was measured in two different signal duplexing schemes: time division duplexing (TDD) and frequency division duplexing (FDD) after using digital predistortion to minimi...
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关键词
Gallium nitride,HEMTs,MODFETs,Logic gates,Electron traps,Performance evaluation,Aluminum gallium nitride
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