Proton and Neutron Induced Single Event Upsets in FPGAs for the PANDA Experiment

IEEE Transactions on Nuclear Science(2020)

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摘要
Single-event upsets (SEUs) affecting the configuration memory of a 28-nm field-programmable gate array (FPGA) have been studied through experiments and Monte Carlo modeling. This FPGA will be used in the front-end electronics of the electromagnetic calorimeter in PANDA (Antiproton Annihilation at Darmstadt), an upcoming hadron-physics experiment. Results from proton and neutron irradiations of the...
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关键词
Field programmable gate arrays,Electromagnetic compatibility,Single event upsets,Neutrons,Protons,Data models
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