Heterodyne interferometry applied to the characterization of nonlinear integrated waveguides.

We demonstrate that heterodyne interferometry makes it possible to accurately measure minute nonlinear phase shifts with little constraint on the propagation loss or chromatic dispersion. We apply this technique to characterize the effective nonlinearity of silicon nitride rib waveguides in the normal and anomalous dispersion regimes. (C) 2020 Optical Society of America