A 1/3-Inch 1.12μm-Pitch 13Mpixel CMOS Image Sensor with a Low-Power Readout Architecture

2020 IEEE International Symposium on Circuits and Systems (ISCAS)(2020)

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摘要
This paper presents an implementation of a CMOS image sensor with a 65 nm CMOS process. The pixel array consists of 13 Mp with 1.12 μm pixel pitch. The fabricated sensor uses 10-bit column-parallel single slope analog-to-digital converters (ADC) based on a low-power readout architecture. Furthermore, a low-power built-in self-test (BIST) is proposed to avoid test over-kills. The proposed image sensor achieves a frame rate of 30–120 frames/s, a temporal random noise of 2 e rms , a dynamic range of 65.2dB, peak integral non-linearity of 0.18 % and peak differential non-linearity of 0.26 least-significant bits. It consumes only 99.7mW at 30 frames/s.
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关键词
Clocks,Decoding,CMOS image sensors,Built-in self-test,Power demand,Analog-digital conversion
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