Sensitive Direct Converting X-Ray Detectors Utilizing Crystalline CsPbBr3 Perovskite Films Fabricated via Scalable Melt Processing

Here the fabrication of an inorganic metal-halide perovskite CsPbBr3 based X-ray detector is reported utilizing a simple, scalable, and cost-sensitive melt processing directly on substrate of any size. X-ray diffraction analysis on the several 100 mm thick melt processed films confirms crystalline domains in the cm(2) range. The CsPbBr3 film features a resistance of 8.5 G omega cm and a hole mobility of 18 cm(2) V-1 s(-1). An X-ray to current conversion rate of 1450 mC Gy(air)(-1) cm(-2) at an electric field of 1.2 x 10(4) V cm(-1) and a detection limit in the sub mu Gy(air) s(-1) regime is demonstrated. The high crystallinity and chemical purity of the melt processed CsPbBr3 films are suggested to be responsible for a performance which is on par to current state-of-the-art Cd(Zn)Te based X-ray detector technology.