Ellipsometric investigation of Fe-based amorphous thin films

M. Dobromir,M. Neagu, H. Chiriac,C. Agheorghiesei, A. Bulai, L. Velicu,F. Borza

OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS(2010)

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摘要
FeSiB amorphous thin films deposited onto glass substrate by pulsed laser method are investigated. The used ablation target was made of Fe(79)Si(9)B(12) amorphous ribbons. The refractive index, extinction coefficient, magneto-optical constant and coercive force of the deposited films have been determined by means of ellipsometry and magneto-optical ellipsometry. The measurements made at 632.8 nm wavelength give 2.3, 1.75 and 0.0177-0.0663j for n, k and Q, respectively.
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关键词
Amorphous thin films,Ellipsometry,Magneto-optical ellipsometry
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