Versatile Dispersion Measurement Via A Reflective Nonlinear Interferometer

2020 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)(2020)

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摘要
We present a novel dispersion measurement technique using a reflective commonpath nonlinear interferometer. Our method is fast, alignment-free, and does not require phase-stabilization. It can extract the dispersion for samples with dispersion-length products as small as D x L similar to 0.007 ps/nm. (C) 2020 The Author(s)
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关键词
versatile dispersion measurement,reflective nonlinear interferometer,novel dispersion measurement technique,reflective common-path nonlinear interferometer,phase-stabilization,dispersion-length products
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