Issues on thickness measurements of nm HfO<sub>2</sub> film by X-ray photoelectron spectroscopyAnsoon Kim, Yoon Sang Lee,Kyung Joong KimJournal of Surface Analysis(2019)引用 0|浏览9暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要